검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Point defect determination by eliminating frequency dispersion in C-V measurement for AlGaN/GaN heterostructure Li L, Yang LA, Zhang JC, Zhang LX, Dang LS, Kuang QW, Hao Y Solid-State Electronics, 68, 98, 2012 |
| No. | Article |
|---|---|
| 1 |
Point defect determination by eliminating frequency dispersion in C-V measurement for AlGaN/GaN heterostructure Li L, Yang LA, Zhang JC, Zhang LX, Dang LS, Kuang QW, Hao Y Solid-State Electronics, 68, 98, 2012 |