검색결과 : 3건
No. | Article |
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1 |
High-temperature reliability of Ni/Nb ohmic contacts on 4H-SiC for harsh environment applications Cuong VV, Ishikawa S, Maeda T, Sezaki H, Yasuno S, Koganezawa T, Miyazaki T, Kuroki SI Thin Solid Films, 669, 306, 2019 |
2 |
Seed-Free Fabrication of Highly Bi-Axially Oriented Poly-Si Thin Films by Continuous-Wave Laser Crystallization with Double-Line Beams Kuroki SI, Kawasaki Y, Fujii S, Kotani K, Ito T Journal of the Electrochemical Society, 158(9), H924, 2011 |
3 |
Characterization of photosensitive low-k films using electron-beam lithography Kuroki SI, Kikkawa T Journal of the Electrochemical Society, 152(4), G281, 2005 |