화학공학소재연구정보센터
검색결과 : 5건
No. Article
1 Atomic structure of CaF2/MnF2-Si(111) superlattices from X-ray diffraction
Alcock SG, Nicklin CL, Howes PB, Norris CA, Kyutt RN, Sokolov NS, Yakovlev NL
Applied Surface Science, 253(8), 3991, 2007
2 Post-growth process relaxation properties of strained Cd0.92Zn0.08Te/Cd0.83Zn0.17Te quantum well heterostructures grown by molecular beam epitaxy
Jacob AP, Myrberg T, Nur O, Willander M, Kyutt RN
Journal of Vacuum Science & Technology B, 22(2), 565, 2004
3 Direct assessment of relaxation and defect propagation in different as-grown and in situ post-growth annealed thin Ge/Si and step-graded Si1-xGex/Si buffer layers
Yousif MYA, Nur O, Willander M, Patel CJ, Hernandez C, Campidelli Y, Bensahel D, Kyutt RN
Solid-State Electronics, 45(11), 1869, 2001
4 Excitons as a probe of interface morphology in Cd(Zn) Se/ZnSe heterostructures
Toropov AA, Shubina TV, Sorokin SV, Kyutt RN, Ivanov SV, Pozina GR, Bergman JP, Monemar B, Karlsteen M, Willander M
Applied Surface Science, 166(1-4), 278, 2000
5 Spatial distribution of Cd in CdSe/ZnSe superlattices studied by X-ray diffraction
Kyutt RN, Toropov AA, Shubina TV, Sorokin SV, Ivanov SV, Karlsteen M, Willander M
Applied Surface Science, 166(1-4), 341, 2000