검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Electrically detected magnetic resonance of near-interface defects in Si pn-junction structures with LOCOS isolation Wimbauer T, Mochizuki Y, Ito K, Horikawa M, Kitano T Applied Surface Science, 159, 72, 2000 |
| 2 |
Control of the slope of field oxide edge and its effects on gate oxide reliability Jang SA, Kim YB, Yeo IS, Lee SK Journal of the Electrochemical Society, 146(1), 270, 1999 |