검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
ESD robustness improving for the low-voltage triggering silicon-controlled rectifier by adding NWell at cathode Jin XL, Zheng YF, Wang Y, Guan JA, Hao SW, Li K, Luo J Solid-State Electronics, 139, 69, 2018 |
| No. | Article |
|---|---|
| 1 |
ESD robustness improving for the low-voltage triggering silicon-controlled rectifier by adding NWell at cathode Jin XL, Zheng YF, Wang Y, Guan JA, Hao SW, Li K, Luo J Solid-State Electronics, 139, 69, 2018 |