검색결과 : 48건
| No. | Article |
|---|---|
| 1 |
X-ray diffraction on stacking faults in 3C-SiC epitaxial microcrystals grown on patterned Si(001) wafers Meduna M, Kreiliger T, Mauceri M, Puglisi M, Mancarella F, La Via F, Crippa D, Miglio L, von Kanel H Journal of Crystal Growth, 507, 70, 2019 |
| 2 |
3C-SiC grown on Si by using a Si1-xGex buffer layer Zimbone M, Zielinski M, Barbagiovanni EG, Calabretta C, La Via F Journal of Crystal Growth, 519, 1, 2019 |
| 3 |
Protrusions reduction in 3C-SiC thin film on Si Zimbone M, Mauceri M, Litrico G, Barbagiovanni EG, Bongiorno C, La Via F Journal of Crystal Growth, 498, 248, 2018 |
| 4 |
Carbonization and transition layer effects on 3C-SiC film residual stress Anzalone R, Litrico G, Piluso N, Reitano R, Alberti A, Fiorenza P, Coffa S, La Via F Journal of Crystal Growth, 473, 11, 2017 |
| 5 |
Sublimation growth of bulk 3C-SiC using 3C-SiC-on-Si (100) seeding layers Schuh P, Scholer M, Wilhelm M, Syvajarvi M, Litrico G, La Via F, Mauceri M, Wellmann PJ Journal of Crystal Growth, 478, 159, 2017 |
| 6 |
Wafer Cut Effect on Hetero-Epitaxial 3C-SiC Film for MEMS Application Anzalone R, Camarda M, Auditore A, Piluso N, Severino A, La Magna A, D'Arrigo G, La Via F Electrochemical and Solid State Letters, 15(6), H182, 2012 |
| 7 |
Stress fields analysis in 3C-SiC free-standing microstructures by micro-Raman spectroscopy Piluso N, Anzalone R, Camarda M, Severino A, D'Arrigo G, La Via F Thin Solid Films, 522, 20, 2012 |
| 8 |
Study of microstructure deflections and film/substrate curvature under generalized stress fields and mechanical properties Camarda M, Anzalone R, La Magna A, La Via F Thin Solid Films, 522, 26, 2012 |
| 9 |
Large area optical characterization of 3 and 4 inches 4H-SiC wafers Canino A, Piluso N, La Via F Thin Solid Films, 522, 30, 2012 |
| 10 |
Defect Influence on Heteroepitaxial 3C-SiC Young's Modulus Anzalone R, Camarda M, Canino A, Piluso N, La Via F, D'Arrigo D Electrochemical and Solid State Letters, 14(4), H161, 2011 |