검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Synchrotron X-ray diffraction topography study of bonding-induced strain in silicon-on-insulator wafers Lankinen A, Tuomi TO, Kostamo P, Jussila H, Sintonen S, Lipsanen H, Tilli M, Makinen J, Danilewsky AN Thin Solid Films, 603, 435, 2016 |
| 2 |
Evaluation of critical thickness of GaP0.98N0.02 layer on GaP substrate by synchrotron X-ray diffraction topography Jussila H, Nagarajan S, Sintonen S, Suihkonen S, Lankinen A, Huhtio T, Paulmann C, Lipsanen H, Tuomi TO, Sopanen M Thin Solid Films, 534, 680, 2013 |
| 3 |
Following the Kinetics of a Chemical Reaction in Ultrathin Supported Polymer Films by Reliable Mass Density Determination with X-ray Reflectivity Kontturi E, Lankinen A Journal of the American Chemical Society, 132(11), 3678, 2010 |
| 4 |
Self-assembly of cationic rod-like poly(2,5-pyridine) by acidic bis(trifluoromethane)sulfonimide in the hydrated state: A highly-ordered self-assembled protonic conductor Vilkman M, Lankinen A, Volk N, Kostamo P, Ikkala O Polymer, 51(18), 4095, 2010 |
| 5 |
Synchrotron topography and X-ray diffraction study of GaInP layers grown on GaAs/Ge Lankinen A, Knuuttila L, Kostamo P, Tuomi TO, Lipsanen H, McNally PJ, O'Reilly L Journal of Crystal Growth, 311(22), 4619, 2009 |
| 6 |
Synchrotron X-ray topographic study of dislocations and stacking faults in InAs Lankinen A, Tuomi T, Riikonen J, Knuuttila L, Lipsanen H, Sopanen M, Danilewsky A, McNally PJ, O'Reilly L, Zhilyaev Y, Fedorov L, Sipila H, Vaijarvi S, Simon R, Lumb D, Owens A Journal of Crystal Growth, 283(3-4), 320, 2005 |