1 |
Leakage Current Suppression in Double Stage SECS Enabling Harmonics Suppression Capabilities Shah P, Singh B IEEE Transactions on Energy Conversion, 36(1), 186, 2021 |
2 |
A New Transformer-Less Five-Level Grid-Tied Inverter for Photovoltaic Applications Vosoughi N, Hosseini SH, Sabahi M IEEE Transactions on Energy Conversion, 35(1), 106, 2020 |
3 |
Current and potential distribution in electrochemical reactors with activated or resistive electrodes. A multiregion and open source approach Colli AN, Bisang JM Electrochimica Acta, 290, 676, 2018 |
4 |
Investigation of Ta2O5 and TaSixOy thin films obtained by radio frequency plasma assisted laser ablation for gate dielectric applications Filipescu M, Ion V, Somacescu S, Mitu B, Dinescu M Applied Surface Science, 276, 691, 2013 |
5 |
Enhanced ferroelectric properties of Mg doped (Ba,Sr)TiO3 thick films grown on (001) SrTiO3 substrates Liu H, Zhu JG, Chen Q, Yu P, Xiao DQ Thin Solid Films, 520(9), 3429, 2012 |
6 |
Scanning Tunneling Microscopy Study of the Multi-Step Deposited and Annealed HfSiOx Gate Dielectric Yew KS, Ang DS, Tang LJ, Cui K, Bersuker G, Lysaght PS Journal of the Electrochemical Society, 158(10), H1021, 2011 |
7 |
Electrically Benign Dry-Etching Method for Rutile TiO2 Thin-Film Capacitors with Ru Electrodes (vol 13, G1, 2010) Kim KM, Lee SY, Choi GJ, Han JH, Hwang CS Electrochemical and Solid State Letters, 13(3), S1, 2010 |
8 |
Investigations of the Electrochemical Stability of Aqueous Electrolytes for Lithium Battery Applications Wessells C, Ruffo R, Huggins RA, Cui Y Electrochemical and Solid State Letters, 13(5), A59, 2010 |
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A 2 Bit Nonvolatile Memory Device with a Transistor Switch Function Accomplished with Edge-FN Tunneling Operation Jian FY, Chang TC, Chu AK, Chen SC, Chen TC, Hsu YE, Tseng HC, Lin CS, Young TF, Yang YL Electrochemical and Solid State Letters, 13(5), H166, 2010 |
10 |
Fabrication of Polycrystalline Si Films by Vapor-Induced Crystallization and Rapid Thermal Annealing Process Yang YH, Ahn KM, Ahn BT Electrochemical and Solid State Letters, 13(8), J92, 2010 |