검색결과 : 13건
| No. | Article |
|---|---|
| 1 |
Estimating the impact of the financial development on energy consumption: Evidence from the GCC (Gulf Cooperation Council) countries Al-mulali U, Lee JYM Energy, 60, 215, 2013 |
| 2 |
Al/Pb(Zr0.53Ti0.47)O-3/Polycrystalline Silicon/Insulator (Y2O3)/Si Field Effect Transistors for Nonvolatile Memory Applications Chan PC, Chang IYK, Juan PC, Lee JYM Electrochemical and Solid State Letters, 13(3), H73, 2010 |
| 3 |
Electrical characteristics of metal-ferroelectric (BiFeO3)-insulator (Y2O3)-semiconductor capacitors and field-effect transistors Lin CM, Shih WC, Lee JYM Journal of Vacuum Science & Technology B, 27(1), 369, 2009 |
| 4 |
Electrical properties of metal-ferroelectric (PbZr0.53Ti0.47O3)-polysilicon-insulator (Y2O3)-silicon capacitors and field-effect transistors Chan PC, Shih WC, Chang IYK, Lee JYM Journal of Vacuum Science & Technology B, 27(3), 1026, 2009 |
| 5 |
Temperature dependence of the current conduction mechanisms in Sm2O3 thin films Chang IYK, Hwang YR, Juan PC, Lee JYM Journal of the Electrochemical Society, 155(12), G265, 2008 |
| 6 |
Advance in next Century nanoCMOSFET research Hwang HL, Chiou YK, Chang CH, Wang CC, Lee KY, Wu TB, Kwo R, Hong M, Chang-Liao KS, Lu CY, Lu CC, Chiu FC, Chen CH, Lee JYM, Chin A Applied Surface Science, 254(1), 236, 2007 |
| 7 |
Temperature dependence of the tunnel-emission conduction current in metal-ZrO2-silicon capacitor structures Wang MT, Wang TH, Cheng BYY, Lee JYM Journal of the Electrochemical Society, 153(1), F8, 2006 |
| 8 |
Stress migration and electromigration improvement for copper dual damascene interconnection Wang TC, Hsieh TE, Wang MT, Su DS, Chang CH, Wang YL, Lee JYM Journal of the Electrochemical Society, 152(1), G45, 2005 |
| 9 |
Electrical conduction mechanism in metal-ZrO2-silicon capacitor structures Wang MT, Wang TH, Lee JYM Journal of the Electrochemical Society, 152(3), G182, 2005 |
| 10 |
The ohmic conduction mechanism in high-dielectric-constant ZrO2 thin films Wang MT, Deng SY, Wang TH, Cheng BYY, Lee JYM Journal of the Electrochemical Society, 152(7), G542, 2005 |