검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Depth profiling of the lateral pore size and correlation distance in thin porous silicon layers by grazing incidence small angle X-ray scattering Ferrero C, Servidori M, Thiaudiere D, Milita S, Lequien S, Sama S, Setzu S, Metzger TH Journal of the Electrochemical Society, 150(7), E366, 2003 |