| 1 |
Theoretical analysis of effects of deep level, back contact, and absorber thickness on capacitance-voltage profiling of CdTe thin-film solar cells
Li JV, Halverson AF, Sulima OV, Bansal S, Burst JM, Barnes TM, Gessert TA, Levi DH
Solar Energy Materials and Solar Cells, 100, 126, 2012 |
| 2 |
Optical Characterization of Pristine Poly(3-Hexyl thiophene) Films
Morfa AJ, Barnes TM, Ferguson AJ, Levi DH, Rumbles G, Rowlen KL, van de Lagemaat J
Journal of Polymer Science Part B: Polymer Physics, 49(3), 186, 2011 |
| 3 |
Complex dielectric function and refractive index spectra of epitaxial CdO thin film grown on r-plane sapphire from 0.74 to 6.45 eV
Choi SG, Zuniga-Perez J, Munoz-Sanjose V, Norman AG, Perkins CL, Levi DH
Journal of Vacuum Science & Technology B, 28(6), 1120, 2010 |
| 4 |
A method to measure resistivity, mobility, and absorber thickness in thin-film solar cells with application to CdTe devices
Li JV, Li XN, Albin DS, Levi DH
Solar Energy Materials and Solar Cells, 94(12), 2073, 2010 |
| 5 |
Influence of sputtering a ZnMgO window layer on the interface and bulk properties of Cu(In,Ga)Se-2 solar cells
Li JV, Li XN, Yan YF, Jiang CS, Metzger WK, Repins IL, Contreras MA, Levi DH
Journal of Vacuum Science & Technology B, 27(6), 2384, 2009 |
| 6 |
Real-time spectroscopic ellipsometry studies of the growth of amorphous and epitaxial silicon for photovoltaic applications
Levi DH, Teplin CW, Iwaniczko E, Yan Y, Wang TH, Branz HM
Journal of Vacuum Science & Technology A, 24(4), 1676, 2006 |
| 7 |
Effect of emitter deposition temperature on surface passivation in hot-wire chemical vapor deposited silicon heterojunction solar cells
Wang TH, Iwaniczko E, Page MR, Levi DH, Yan Y, Branz HM, Wang Q
Thin Solid Films, 501(1-2), 284, 2006 |
| 8 |
In-situ studies of the growth of amorphous and nanocrystalline silicon using real time spectroscopic ellipsometry
Levi DH, Nelson BP, Iwanizcko E, Teplin CW
Thin Solid Films, 455-56, 679, 2004 |
| 9 |
In situ studies of the amorphous to microcrystalline transition of hot-wire chemical vapor deposition Si : H films using real-time spectroscopic ellipsometry
Levi DH, Nelson BP, Perkins JD, Moutinho HR
Journal of Vacuum Science & Technology A, 21(4), 1545, 2003 |
| 10 |
Investigation of induced recrystallization and stress in close-spaced sublimated and radio-frequency magnetron sputtered CdTe thin films
Moutinho HR, Dhere RG, Al-Jassim MM, Levi DH, Kazmerski LL
Journal of Vacuum Science & Technology A, 17(4), 1793, 1999 |
