검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Determination of trace metallic impurities on 200-mm silicon wafers by time-of-flight secondary-ion-mass spectroscopy Chu PK, Schueler BW, Reich F, Lindley PM Journal of Vacuum Science & Technology B, 15(6), 1908, 1997 |
| 2 |
Comparison of Submicron Particle Analysis by Auger-Electron Spectroscopy, Time-of-Flight Secondary-Ion Mass-Spectrometry, and Secondary-Electron Microscopy with Energy-Dispersive X-Ray Spectroscopy Childs KD, Narum D, Lavanier LA, Lindley PM, Schueler BW, Mulholland G, Diebold AC Journal of Vacuum Science & Technology A, 14(4), 2392, 1996 |
| 3 |
Effect of Acetate Distribution on Surface Segregation in Poly(Vinyl Alcohol-Co-Vinyl Acetate) Copolymer Films Helfand MA, Mazzanti JB, Fone M, Reamey RH, Lindley PM Langmuir, 12(5), 1296, 1996 |