검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Analysis of Surface Void Fraction Using Atomic-Force Microscopy Lindquist CS, Urban FK Journal of Vacuum Science & Technology A, 14(3), 1957, 1996 |
| 2 |
Surface-Analysis Algorithms for Scanning Probe Microscopy Lindquist CS, Urban FK Thin Solid Films, 270(1-2), 399, 1995 |