검색결과 : 18건
| No. | Article |
|---|---|
| 1 |
Structure of a model TiO2 photocatalytic interface Hussain H, Tocci G, Woolcot T, Torrelles X, Pang CL, Humphrey DS, Yim CM, Grinter DC, Cabailh G, Bikondoa O, Lindsay R, Zegenhagen J, Michaelides A, Thornton G Nature Materials, 16(4), 461, 2017 |
| 2 |
Structure of Clean and Adsorbate-Covered Single-Crystal Rutile TiO2 Surfaces Pang CL, Lindsay R, Thornton G Chemical Reviews, 113(6), 3887, 2013 |
| 3 |
Quantitative Orientation Analysis by Sum Frequency Generation in the Presence of Near-Resonant Background Signal: Acetonitrile on Rutile TiO2 (110) Jang JH, Lydiatt F, Lindsay R, Baldelli S Journal of Physical Chemistry A, 117(29), 6288, 2013 |
| 4 |
Application of flash-assist rapid thermal processing subsequent to low-temperature furnace anneals Camillo-Castillo RA, Law ME, Jones KS, Lindsay R, Maex K, Pawlak BJ, McCoy S Journal of Vacuum Science & Technology B, 24(1), 450, 2006 |
| 5 |
A new technique to fabricate ultra-shallow-junctions, combining in situ vapour HCl etching and in situ doped epitaxial SiGe re-growth Loo R, Caymax M, Meunier-Beillard P, Peytier I, Holsteyns F, Kubicek S, Verheyen P, Lindsay R, Richard O Applied Surface Science, 224(1-4), 63, 2004 |
| 6 |
Structure determination of formic acid reaction products on TiO2(110) Sayago DI, Polcik M, Lindsay R, Toomes RL, Hoeft JT, Kittel M, Woodruff DP Journal of Physical Chemistry B, 108(38), 14316, 2004 |
| 7 |
Chemical and electrical dopants profile evolution during solid phase epitaxial regrowth Pawlak BJ, Lindsay R, Surdeanu R, Dieu B, Geenen L, Hoflijk I, Richard O, Duffy R, Clarysse T, Brijs B, Vandervorst W, Dachs CJJ Journal of Vacuum Science & Technology B, 22(1), 297, 2004 |
| 8 |
Leakage optimization of ultra-shallow junctions formed by solid phase epitaxial regrowth Lindsay R, Henson K, Vandervorst W, Maex K, Pawlak BJ, Duffy R, Surdeanu R, Stolk P, Kittl JA, Giangrandi S, Pages X, van der Jeugd K Journal of Vacuum Science & Technology B, 22(1), 306, 2004 |
| 9 |
Carrier illumination for characterization of ultrashallow doping profiles Clarysse T, Lindsay R, Vandervorst W, Budiarto E, Borden P Journal of Vacuum Science & Technology B, 22(1), 439, 2004 |
| 10 |
An (un)solvable problem in SIMS: B-interfacial profiling Vandervorst W, Janssens T, Loo R, Caymax M, Peytier I, Lindsay R, Fruhauf J, Bergmaier A, Dollinger G Applied Surface Science, 203, 371, 2003 |