1 |
The influence of deposition temperature on the structure, microstructure, morphology and magnetic properties of sputter deposited nickel thin films Sharma A, Mohan S, Suwas S Thin Solid Films, 619, 91, 2016 |
2 |
Characterization of structural changes of mechanically activated natural pyrite using XRD line profile analysis Pourghahramani P, Akhgar BN International Journal of Mineral Processing, 134, 23, 2015 |
3 |
Microstructure evaluation of nanocrystalline MgO powders using the advanced X-ray line profile analysis Soleimanian V, Abedi M, Aghdaee SR Journal of Crystal Growth, 411, 4, 2015 |
4 |
Parametric line profile analysis for in situ XRD of SnO2 materials: Separation of size and strain contributions Pavelko RG, Gispert-Guirado F, Llobet E Solid State Ionics, 255, 21, 2014 |
5 |
Atomistic interpretation of microstrain in diffraction line profile analysis Leonardi A, Leoni M, Scardi P Thin Solid Films, 530, 40, 2013 |
6 |
Solid State Nuclear Magnetic Resonance and X-ray Diffraction Line Profile Analysis of heavily deformed fluorite Abdellatief M, Abele M, Leoni M, Scardi P Thin Solid Films, 530, 44, 2013 |
7 |
Characterization of Different Shaped Nanocrystallites using X-ray Diffraction Line Profiles Li ZQ Particle & Particle Systems Characterization, 28(1-2), 19, 2012 |
8 |
Microstructural evolution of ball-milled MgH2 during a complete dehydrogenation-hydrogenation cycle Revesz A, Fatay D Journal of Power Sources, 195(20), 6997, 2010 |
9 |
Microstructural development in nanocrystalline MgH(2) during H-absorption/desorption cycling Fatay D, Spassov T, Delchev P, Ribarik G, Revesz A International Journal of Hydrogen Energy, 32(14), 2914, 2007 |
10 |
Microstructure of ultrafine-grained fcc metals produced by severe plastic deformation Gubicza J, Chinh NQ, Krallics G, Schiller I, Ungar T Current Applied Physics, 6(2), 194, 2006 |