검색결과 : 1건
No. | Article |
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1 |
Advanced CAD methodology for history effect characterization in partially depleted SOI libraries Liot V, Flatresse P, Fournier JM, Belleville M Solid-State Electronics, 49(9), 1466, 2005 |
No. | Article |
---|---|
1 |
Advanced CAD methodology for history effect characterization in partially depleted SOI libraries Liot V, Flatresse P, Fournier JM, Belleville M Solid-State Electronics, 49(9), 1466, 2005 |