화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 Determination of doping profiles on bevelled GaAs structures by Raman spectroscopy
Srnanek R, Kinder R, Sciana B, Radziewicz D, McPhail DS, Littlewood SD, Novotny I
Applied Surface Science, 177(1-2), 139, 2001
2 Origins of Atmospheric Contamination in Amorphous-Silicon Prepared by Very High-Frequency (70 MHz) Glow-Discharge
Kroll U, Meier J, Keppner H, Shah A, Littlewood SD, Kelly IE, Giannoules P
Journal of Vacuum Science & Technology A, 13(6), 2742, 1995