검색결과 : 10건
No. | Article |
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1 |
Simulation of interfacial pH changes during hydrogen evolution reaction Carneiro-Neto EB, Lopes MC, Pereira EC Journal of Electroanalytical Chemistry, 765, 92, 2016 |
2 |
The genome of a Late Pleistocene human from a Clovis burial site in western Montana Rasmussen M, Anzick SL, Waters MR, Skoglund P, DeGiorgio M, Stafford TW, Rasmussen S, Moltke I, Albrechtsen A, Doyle SM, Poznik GD, Gudmundsdottir V, Yadav R, Malaspinas AS, White SS, Allentoft ME, Cornejo OE, Tambets K, Eriksson A, Heintzman PD, Karmin M, Korneliussen TS, Meltzer DJ, Pierre TL, Stenderup J, Saag L, Warmuth VM, Lopes MC, Malhi RS, Brunak S, Sicheritz-Ponten T, Barnes I, Collins M, Orlando L, Balloux F, Manica A, Gupta R, Metspalu M, Bustamante CD, Jakobsson M, Nielsen R, Willerslev E Nature, 506(7487), 225, 2014 |
3 |
Computational modeling of the template-assisted deposition of nanowires Lopes MC, de Oliveira CP, Pereira EC Electrochimica Acta, 53(13), 4359, 2008 |
4 |
Solvent sorption measurements in polymeric membranes with ATR-IR spectroscopy Pereira AMM, Lopes MC, Timmer JMK, Keurentjes JTF Journal of Membrane Science, 260(1-2), 174, 2005 |
5 |
Early stages of the lead-acid battery discharge de Oliveira CR, Lopes MC Journal of Power Sources, 138(1-2), 294, 2004 |
6 |
Negative plate discharge in lead acid batteries. Part I: General analysis, utilization and energetic coefficients D'Alkaine CV, Carubelli A, Lopes MC Journal of Applied Electrochemistry, 30(5), 585, 2000 |
7 |
The role of FeS and (NH4)(2)CO3 additives on the pressed type Fe electrode Caldas CA, Lopes MC, Carlos IA Journal of Power Sources, 74(1), 108, 1998 |
8 |
Si-SiO2 Electronic Interface Roughness as a Consequence of Si-SiO2 Topographic Interface Roughness Lopes MC, Dossantos SG, Hasenack CM, Baranauskas V Journal of the Electrochemical Society, 143(3), 1021, 1996 |
9 |
2 Adaptive-Grid Methods for Fixed-Bed Systems Simulation Oliveira F, Deoliveira P, Lopes MC, Castro JA Computers & Chemical Engineering, 18(3), 227, 1994 |
10 |
Numerical-Calculations of the Electrical Effects Induced by Structural Imperfections on MOS Capacitors Lopes MC, Hasenack CM, Baranauskas V Journal of the Electrochemical Society, 141(6), 1621, 1994 |