화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Simulation of interfacial pH changes during hydrogen evolution reaction
Carneiro-Neto EB, Lopes MC, Pereira EC
Journal of Electroanalytical Chemistry, 765, 92, 2016
2 The genome of a Late Pleistocene human from a Clovis burial site in western Montana
Rasmussen M, Anzick SL, Waters MR, Skoglund P, DeGiorgio M, Stafford TW, Rasmussen S, Moltke I, Albrechtsen A, Doyle SM, Poznik GD, Gudmundsdottir V, Yadav R, Malaspinas AS, White SS, Allentoft ME, Cornejo OE, Tambets K, Eriksson A, Heintzman PD, Karmin M, Korneliussen TS, Meltzer DJ, Pierre TL, Stenderup J, Saag L, Warmuth VM, Lopes MC, Malhi RS, Brunak S, Sicheritz-Ponten T, Barnes I, Collins M, Orlando L, Balloux F, Manica A, Gupta R, Metspalu M, Bustamante CD, Jakobsson M, Nielsen R, Willerslev E
Nature, 506(7487), 225, 2014
3 Computational modeling of the template-assisted deposition of nanowires
Lopes MC, de Oliveira CP, Pereira EC
Electrochimica Acta, 53(13), 4359, 2008
4 Solvent sorption measurements in polymeric membranes with ATR-IR spectroscopy
Pereira AMM, Lopes MC, Timmer JMK, Keurentjes JTF
Journal of Membrane Science, 260(1-2), 174, 2005
5 Early stages of the lead-acid battery discharge
de Oliveira CR, Lopes MC
Journal of Power Sources, 138(1-2), 294, 2004
6 Negative plate discharge in lead acid batteries. Part I: General analysis, utilization and energetic coefficients
D'Alkaine CV, Carubelli A, Lopes MC
Journal of Applied Electrochemistry, 30(5), 585, 2000
7 The role of FeS and (NH4)(2)CO3 additives on the pressed type Fe electrode
Caldas CA, Lopes MC, Carlos IA
Journal of Power Sources, 74(1), 108, 1998
8 Si-SiO2 Electronic Interface Roughness as a Consequence of Si-SiO2 Topographic Interface Roughness
Lopes MC, Dossantos SG, Hasenack CM, Baranauskas V
Journal of the Electrochemical Society, 143(3), 1021, 1996
9 2 Adaptive-Grid Methods for Fixed-Bed Systems Simulation
Oliveira F, Deoliveira P, Lopes MC, Castro JA
Computers & Chemical Engineering, 18(3), 227, 1994
10 Numerical-Calculations of the Electrical Effects Induced by Structural Imperfections on MOS Capacitors
Lopes MC, Hasenack CM, Baranauskas V
Journal of the Electrochemical Society, 141(6), 1621, 1994