검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O-2 atmosphere Hosokai T, Hinderhofer A, Vorobiev A, Lorch C, Watanabe T, Koganezawa T, Gerlach A, Yoshimoto N, Kubozono Y, Schreiber F Chemical Physics Letters, 544, 34, 2012 |