검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Practical Perspective of Shallow Junction Analysis Heimbrook LA, Baiocchi FA, Bittner TC, Geva M, Luftman HS, Nakahara S Journal of Vacuum Science & Technology B, 14(1), 202, 1996 |
| 2 |
Surface Roughness-Induced Artifacts in Secondary-Ion Mass-Spectrometry Depth Profiling and a Simple Technique to Smooth the Surface Herner SB, Gila BP, Jones KS, Gossmann HJ, Poate JM, Luftman HS Journal of Vacuum Science & Technology B, 14(6), 3593, 1996 |
| 3 |
Electron-Beam-Induced Current Determination of Shallow Junction Depth Fitzgerald EA, Gossmann HJ, Unterwald FC, Luftman HS, Monroe D Journal of Vacuum Science & Technology B, 12(1), 357, 1994 |
| 4 |
Electrical and Structural Characterization of Boron-Doped Si1-xGex Strained Layers Moriya N, Feldman LC, Luftman HS, King CA Journal of Vacuum Science & Technology B, 12(1), 383, 1994 |
| 5 |
Interface Analysis of Dry-Etched and Molecular-Beam Epitaxial Regrown AlGaAs Grober LH, Hong M, Mannaerts JP, Freund RS, Luftman HS, Chu SN Journal of Vacuum Science & Technology B, 12(2), 1038, 1994 |
| 6 |
Hydrogen Plasma Processing of GaAs and AlGaAs Choquette KD, Freund RS, Hong M, Luftman HS, Chu SN, Mannaerts JP, Wetzel RC Journal of Vacuum Science & Technology B, 11(6), 2025, 1993 |