화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Elimination of the channel current effect on the characterization of MOSFET threshold voltage using junction capacitance measurements
Tomaszewski D, Gluszko G, Lukasiak L, Kucharski K, Malesinska J
Solid-State Electronics, 128, 92, 2017
2 Analysis of surface and interface charge interactions in silicon on insulator (SOI) substrates
Lukasiak L, Roman P, Jakubowski A, Ruzyllo J
Solid-State Electronics, 45(1), 95, 2001
3 Modeling of SiGe-base heterojunction bipolar transistor with gaussian doping distribution
Zareba A, Lukasiak L, Jakubowski A
Solid-State Electronics, 45(12), 2029, 2001