검색결과 : 1건
| No. | Article |
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| 1 |
Electrical characterizations of resistive random access memory devices based on GaV4S8 thin layers Tranchant J, Janod E, Cario L, Corraze B, Souchier E, Leclercq JL, Cremillieu P, Moreau P, Besland MP Thin Solid Films, 533, 61, 2013 |