검색결과 : 1건
No. | Article |
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1 |
Breakdown and anti-breakdown events in high-field stressed ultrathin gate oxides Miranda E, Sune J, Rodriguez R, Nafria M, Aymerich X Solid-State Electronics, 45(8), 1327, 2001 |
No. | Article |
---|---|
1 |
Breakdown and anti-breakdown events in high-field stressed ultrathin gate oxides Miranda E, Sune J, Rodriguez R, Nafria M, Aymerich X Solid-State Electronics, 45(8), 1327, 2001 |