검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Anomalous behavior of van der Pauw sheet resistance measurements on 4H-SiC MOS inversion layers with anisotropic mobility Saks NS, Ancona MG, Lipkin LA Materials Science Forum, 457-460, 689, 2004 |
| 2 |
Zero-point correction of the carrier density in the measurement of MOS inversion-layer mobility Terada K, Okamoto S Solid-State Electronics, 47(9), 1457, 2003 |