검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Effects of dislocations on reliability of thermal oxides grown on n-type 4H-SiC wafer Senzaki J, Kojima K, Kato T, Shimozato A, Fukuda K Materials Science Forum, 483, 661, 2005 |
| 2 |
A long-term reliability of thermal oxides grown on n-type 4H-SiC wafer Senzaki J, Goto M, Kojima K, Yamabe K, Fukuda K Materials Science Forum, 457-460, 1269, 2004 |
| 3 |
Reliability and degradation of metal-oxide-semiconductor capacitors on 4H-and 6H-silicon carbide Treu M, Schorner R, Friedrichs P, Rupp R, Wiedenhofer A, Stephani D, Ryssel H Materials Science Forum, 338-3, 1089, 2000 |