| 1 |
Depth resolution and preferential sputtering in depth profiling of delta layers
Hofmann S, Lian SY, Han YS, Liu Y, Wang JY
Applied Surface Science, 455, 1045, 2018 |
| 2 |
Quantitative evaluation of sputtering induced surface roughness and its influence on AES depth profiles of polycrystalline Ni/Cu multilayer thin films
Yan XL, Coetsee E, Wang JY, Swart HC, Terblans JJ
Applied Surface Science, 411, 73, 2017 |
| 3 |
Depth resolution and preferential sputtering in depth profiling of sharp interfaces
Hofmann S, Han YS, Wang JY
Applied Surface Science, 410, 354, 2017 |
| 4 |
Investigation of interdiffusion and depth resolution in Cu/Ni multilayers by means of AES depth profiling
Yan XL, Liu Y, Swart HC, Wang JY, Terblans JJ
Applied Surface Science, 364, 567, 2016 |
| 5 |
Reconstruction of GaAs/AlAs supperlattice multilayer structure by quantification of AES and SIMS sputter depth profiles
Kang HL, Lao JB, Li ZP, Yao WQ, Liu C, Wang JY
Applied Surface Science, 388, 584, 2016 |
| 6 |
Quantitative reconstruction of the GDOES sputter depth profile of a monomolecular layer structure of thiourea on copper
Liu Y, Jian W, Wang JY, Hofmann S, Shimizu K
Applied Surface Science, 331, 140, 2015 |
| 7 |
Quantitative reconstruction of Ta/Si multilayer depth profiles obtained by Time-of-Flight-Secondary-Ion-Mass-Spectrometry (ToF-SIMS) using Cs+ ion sputtering
Liu Y, Hofmann S, Wang JY, Chakraborty BR
Thin Solid Films, 591, 60, 2015 |
| 8 |
Recovery of SIMS depth profiles with account for nonstationary effects
Yunin PA, Drozdov YN, Drozdov MN, Yurasova DV
Applied Surface Science, 307, 33, 2014 |
| 9 |
Analytical and numerical depth resolution functions in sputter profiling
Hofmann S, Liu Y, Wang JY, Kovac J
Applied Surface Science, 314, 942, 2014 |
| 10 |
Influence of non-Gaussian roughness on sputter depth profiles
Liu Y, Jian W, Wang JY, Hofmann S, Kovac J
Applied Surface Science, 276, 447, 2013 |
