검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Detection of Interfacial Gas Bubbles in Wafer Bonded Silicon with Different Surface Treatments Horn G, Gabriel M, Lesniak J, Mackin TJ Journal of the Electrochemical Society, 156(1), H27, 2009 |
| 2 |
Detection and quantification of surface nanotopography-induced residual stress fields in wafer-bonded silicon Horn G, Chu YS, Zhong YC, Mackin TJ, Lesniak JR, Reiniger D Journal of the Electrochemical Society, 155(1), H36, 2008 |
| 3 |
Measuring film thickness using infrared imaging Decker CA, Mackin TJ Thin Solid Films, 473(2), 196, 2005 |
| 4 |
Evaluation of damage evolution in ceramic-matrix composites using thermoelastic stress analysis Mackin TJ, Roberts MC Journal of the American Ceramic Society, 83(2), 337, 2000 |