검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Combined molecular beam epitaxy low temperature scanning tunneling microscopy system: Enabling atomic scale characterization of semiconductor surfaces and interfaces Krause M, Stollenwerk A, Awo-Affouda C, Maclean B, LaBella VP Journal of Vacuum Science & Technology B, 23(4), 1684, 2005 |