검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
The effects of hydrogen annealing on gate oxide integrity of U-shaped trench MOSFET with 400 A gate oxide Wu CT, Sharp J, Madson G, Michalowicz J Journal of the Electrochemical Society, 153(10), G916, 2006 |
| 2 |
The effect of carrier gas in gate oxidation on the gate oxide integrity of thick gate oxide for UMOSFETs Wu CT, Woolsey DS, Madson G, Michalowicz J Journal of the Electrochemical Society, 152(9), F142, 2005 |