검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Impact of nitridation on recoverable and permanent negative bias temperature instability degradation in high-k/metal-gate p-type metal oxide semiconductor field effect transistors Aoulaiche M, Kaczer B, Roussel PJ, O'Connor R, Houssa M, De Gendt S, Maes HE, Groeseneken G Journal of Vacuum Science & Technology B, 27(1), 463, 2009 |
| 2 |
Determining weak Fermi-level pinning in MOS devices by conductance and capacitance analysis and application to GaAs MOS devices Martens K, Wang WF, Dimoulas A, Borghs G, Meuris M, Groeseneken G, Maes HE Solid-State Electronics, 51(8), 1101, 2007 |
| 3 |
Stresses in Strained Gesi Stripes and Quantum Structures - Calculation Using the Finite-Element Method and Determination Using Micro-Raman and Other Measurements Jain SC, Maes HE, Pinardi K Thin Solid Films, 292(1-2), 218, 1997 |