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| No. | Article |
|---|---|
| 1 |
Characterization of molecular nitrogen in III-V compound semiconductors by near-edge x-ray absorption fine structure and photoemission spectroscopies Bozanic A, Majlinger Z, Petravic M, Gao Q, Llewellyn D, Crotti C, Yang YW Journal of Vacuum Science & Technology A, 26(4), 592, 2008 |