검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Schottky-Barrier Height Measurement on Nisi2/Si(100) by Capacitance Microscope Khang Y, Mang KM, Booh KH, Kuk Y Journal of Vacuum Science & Technology B, 14(2), 1221, 1996 |
| 2 |
Direct Imaging of SiO2 Thickness Variation on Si Using Modified Atomic-Force Microscope Mang KM, Khang Y, Park YJ, Kuk Y, Lee SM, Williams CC Journal of Vacuum Science & Technology B, 14(2), 1536, 1996 |
| 3 |
Structure of Nickel Silicide on Si(001) - An Atomic View Khang Y, Kahng SJ, Mang KM, Jeon D, Lee JH, Kim YN, Kuk Y Journal of Vacuum Science & Technology B, 12(3), 2094, 1994 |