검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Ellipsometry for III-V Epitaxial-Growth Diagnostics Maracas GN, Kuo CH, Anand S, Droopad R, Sohie GR, Levola T Journal of Vacuum Science & Technology A, 13(3), 727, 1995 |
| 2 |
Measurement of AlxGa1-xAs Temperature-Dependent Optical-Constants by Spectroscopic Ellipsometry Kuo CH, Anand S, Fathollahnejad H, Ramamurti R, Droopad R, Maracas GN Journal of Vacuum Science & Technology B, 13(2), 681, 1995 |
| 3 |
Application of the Digital Alloy Composition Grading Technique to Strained InGaAs/GaAs/AlGaAs Diode-Laser Active Regions Cody JG, Mathine DL, Droopad R, Maracas GN, Rajesh R, Carpenter RW Journal of Vacuum Science & Technology B, 12(2), 1075, 1994 |
| 4 |
Determination of Molecular-Beam Epitaxial-Growth Parameters by Ellipsometry Droopad R, Kuo CH, Anand S, Choi KY, Maracas GN Journal of Vacuum Science & Technology B, 12(2), 1211, 1994 |
| 5 |
Measurement of GaAs Temperature-Dependent Optical-Constants by Spectroscopic Ellipsometry Kuo CH, Anand S, Droopad R, Choi KY, Maracas GN Journal of Vacuum Science & Technology B, 12(2), 1214, 1994 |