검색결과 : 1건
No. | Article |
---|---|
1 |
Comparison between TCAD simulated and measured carrier lifetimes in CMOS photodiodes using the Open Circuit Voltage Decay method Marcelot O, Magnan P Solid-State Electronics, 81, 135, 2013 |
No. | Article |
---|---|
1 |
Comparison between TCAD simulated and measured carrier lifetimes in CMOS photodiodes using the Open Circuit Voltage Decay method Marcelot O, Magnan P Solid-State Electronics, 81, 135, 2013 |