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| No. | Article |
|---|---|
| 1 |
Quantification of strain through linear dichroism in the Si 1s edge X-ray absorption spectra of strained Si1-xGex thin films Cao W, Masnadi M, Eger S, Martinson M, Xiao QF, Hu YF, Baribeau JM, Woicik JC, Hitchcock AP, Urquhart SG Applied Surface Science, 265, 358, 2013 |