검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Infrared ellipsometry of SiC/Si heterostructures with Ge modified interfaces Zgheib C, Forster C, Weih R, Cimalla V, Kazan M, Masri R, Ambacher O, Pezoldt J Thin Solid Films, 455-56, 183, 2004 |
| No. | Article |
|---|---|
| 1 |
Infrared ellipsometry of SiC/Si heterostructures with Ge modified interfaces Zgheib C, Forster C, Weih R, Cimalla V, Kazan M, Masri R, Ambacher O, Pezoldt J Thin Solid Films, 455-56, 183, 2004 |