화학공학소재연구정보센터
검색결과 : 18건
No. Article
1 Phase separation in metallic glasses
Kim DH, Kim WT, Park ES, Mattern N, Eckert J
PROGRESS IN MATERIALS SCIENCE, 58(8), 1103, 2013
2 Phase separation in monotectic alloys as a route for liquid state fabrication of composite materials
Kaban I, Kohler M, Ratke L, Nowak R, Sobczak N, Mattern N, Eckert J, Greer AL, Sohn SW, Kim DH
Journal of Materials Science, 47(24), 8360, 2012
3 Sessile drop study of Gd-Ti monotectic alloys on ceramic substrates: phase transformations, wetting, and reactivity
Kaban I, Nowak R, Shuleshova O, Korpala B, Bruzda G, Siewiorek A, Han JH, Sobczak N, Mattern N, Eckert J
Journal of Materials Science, 47(24), 8381, 2012
4 Microstructure of Co2CrxFe1-xAl thin films for magneto-electronic applications
Wilde L, Schumann J, Thomas J, Bacher I, Mattern N, Gemming T, Kaltofen R, Elefant D, Oswald S
Thin Solid Films, 515(17), 6781, 2007
5 Effect of nitrogen content on the degradation mechanisms of thin Ta-Si-N diffusion barriers for Cu metallization
Hubner R, Hecker M, Mattern N, Hoffmann V, Wetzig K, Heuer H, Wenzel C, Engelmann HJ, Gehre D, Zschech E
Thin Solid Films, 500(1-2), 259, 2006
6 Effect of annealing on structural properties of Co thin films and Co/Cu multilayers
Hecker M, Mattern N, Bruckner W, Schneider CM
Materials Science Forum, 443-4, 193, 2004
7 Structure of Zr52Ti5CU18Ni15Al10 bulk metallic glass at elevated temperatures
Mattern N, Kuhn U, Sakowski J, Neuefeind J, Eckert J
Materials Science Forum, 443-4, 227, 2004
8 Degradation mechanisms of Ta and Ta-Si diffusion barriers during thermal stressing
Hubner R, Hecker M, Mattern N, Hoffmann V, Wetzig K, Wenger C, Engelmann HJ, Wenzel C, Zschech E
Thin Solid Films, 458(1-2), 237, 2004
9 Influence of nitrogen content on the crystallization behavior of thin Ta-Si-N diffusion barriers
Hubner R, Hecker M, Mattern N, Voss A, Acker J, Hoffmann V, Wetzig K, Engelmann HJ, Zschech E, Heuer H, Wenzel C
Thin Solid Films, 468(1-2), 183, 2004
10 Crystallization behavior of CoSb3 and (Co,Fe)Sb-3 thin films
Schupp B, Bacher I, Hecker M, Mattern N, Savchuk V, Schumann J
Thin Solid Films, 434(1-2), 75, 2003