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| No. | Article |
|---|---|
| 1 |
Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures Domanowska A, Miczek M, Ucka R, Matys M, Adamowicz B, Zywicki J, Taube A, Korwin-Mikke K, Gieraltowska S, Sochacki M Applied Surface Science, 258(21), 8354, 2012 |