검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
A correlation of TOF-SIMS and TXRF for the analysis of trace metal contamination on silicon and gallium arsenide Mowat I, Lindley P, McCaig L Applied Surface Science, 203, 495, 2003 |
| 2 |
Surface metal standards produced by ion implantation through a removable layer Schueler BW, Granger CN, McCaig L, McKinley JM, Metz J, Mowat I, Reich DF, Smith S, Stevie FA, Yang MH Applied Surface Science, 203, 847, 2003 |