검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Crystal structure of unphosphorylated STAT3 core fragment Ren ZY, Mao X, Mertens C, Krishnaraj R, Qin J, Mandal PK, Romanowski MJ, McMurray JS, Chen XM Biochemical and Biophysical Research Communications, 374(1), 1, 2008 |
| 2 |
Application of electron holography to analysis of submicron structures Gribelyuk MA, Domenicucci AG, Ronsheim PA, McMurray JS, Gluschenkov O Journal of Vacuum Science & Technology B, 26(1), 408, 2008 |
| 3 |
Two dimensional dopant and carrier profiles obtained by scanning capacitance microscopy on an actively biased cross-sectioned metal-oxide-semiconductor field-effect transistor Zavyalov VV, McMurray JS, Stirling SD, Williams CC, Smith H Journal of Vacuum Science & Technology B, 18(1), 549, 2000 |
| 4 |
Noise in scanning capacitance microscopy measurements Zavyalov VV, McMurray JS, Williams CC Journal of Vacuum Science & Technology B, 18(3), 1125, 2000 |
| 5 |
Direct comparison of two-dimensional dopant profiles by scanning capacitance microscopy with TSUPREM4 process simulation McMurray JS, Kim J, Williams CC, Slinkman J Journal of Vacuum Science & Technology B, 16(1), 344, 1998 |
| 6 |
Epitaxial staircase structure for the calibration of electrical characterization techniques Clarysse T, Caymax M, De Wolf P, Trenkler T, Vandervorst W, McMurray JS, Kim J, Williams CC, Clark JG, Neubauer G Journal of Vacuum Science & Technology B, 16(1), 394, 1998 |
| 7 |
Quantitative Measurement of 2-Dimensional Dopant Profile by Cross-Sectional Scanning Capacitance Microscopy Mcmurray JS, Kim J, Williams CC Journal of Vacuum Science & Technology B, 15(4), 1011, 1997 |