검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Time-of-flight secondary ion mass spectrometry depth profiling of multiple quantum well II-VI semiconductors using negative cluster ions Zhao J, Na MH, McKeown PJ, Chang HC, Lee EH, Luo H, Chen JX, Wood TD, Gardella JA Journal of Vacuum Science & Technology B, 17(1), 224, 1999 |
| 2 |
Visualization of a Buried Organic Interlace by Imaging Time-of-Flight Secondary-Ion Mass-Spectrometry and Scanning Auger Microprobe of an Ion-Beam Crater Edge Schamberger PC, Jones GL, Gardella JA, Mckeown PJ, Davis LE Journal of Vacuum Science & Technology A, 14(4), 2289, 1996 |