화학공학소재연구정보센터
검색결과 : 4건
No. Article
1 Low voltage and temperature effects on SILC in stressed ultrathin oxide films
Meinertzhagen A, Zander D, Petit C, Jourdain M, Gogenheim D
Solid-State Electronics, 45(8), 1371, 2001
2 Anode hole injection and stress induced leakage current decay in metal-oxide-semiconductor capacitors
Meinertzhagen A, Petit C, Jourdain M, Mondon F
Solid-State Electronics, 44(4), 623, 2000
3 Stress-Field Polarity Effect on Defects Generation in Thin Silicon Dioxide Films
Elhdiy A, Salace G, Jourdain M, Meinertzhagen A, Vuillaume D
Thin Solid Films, 296(1-2), 106, 1997
4 On the Frequency Loss of Metal-Oxide-Semiconductor Structures Under Depletion and Weak Inversion
Meinertzhagen A, Elrharbi S, Petit C, Jourdain M
Thin Solid Films, 256(1-2), 253, 1995