검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Correlated X-ray Ptychography and Fluorescence Nano-Tomography on the Fragmentation Behavior of an Individual Catalyst Particle during the Early Stages of Olefin Polymerization Bossers KW, Valadian R, Zanoni S, Smeets R, Friederichs N, Garrevoet J, Meirer F, Weckhuysen BM Journal of the American Chemical Society, 142(8), 3691, 2020 |
| 2 |
Single-Molecule Fluorescence Microscopy Reveals Local Diffusion Coefficients in the Pore Network of an Individual Catalyst Particle Hendriks FC, Meirer F, Kubarev AV, Ristanovic Z, Roeffaers MBJ, Vogt ETC, Bruijnincx PCA, Weckhuysen BM Journal of the American Chemical Society, 139(39), 13632, 2017 |
| 3 |
Evolution of arsenic in high fluence plasma immersion ion implanted silicon: Behavior of the as-implanted Surface Vishwanath V, Demenev E, Giubertoni D, Vanzetti L, Koh AL, Steinhauser G, Pepponi G, Bersani M, Meirer F, Foad MA Applied Surface Science, 355, 792, 2015 |
| 4 |
Mapping Metals Incorporation of a Whole Single Catalyst Particle Using Element Specific X-ray Nanotomography Meirer F, Morris DT, Kalirai S, Liu YJ, Andrews JC, Weckhuysen BM Journal of the American Chemical Society, 137(1), 102, 2015 |
| 5 |
Quantitative 3D Fluorescence Imaging of Single Catalytic Turnovers Reveals Spatiotemporal Gradients in Reactivity of Zeolite H-ZSM-5 Crystals upon Steaming Ristanovic Z, Hofmann JP, De Cremer G, Kubarev AV, Rohnke M, Meirer F, Hofkens J, Roeffaers MBJ, Weckhuysen BM Journal of the American Chemical Society, 137(20), 6559, 2015 |
| 6 |
Aluminum-Phosphate Binder Formation in Zeolites as Probed with X-ray Absorption Microscopy van der Bij HE, Cicmil D, Wang J, Meirer F, de Groot FMF, Weckhuysen BM Journal of the American Chemical Society, 136(51), 17774, 2014 |
| 7 |
Deactivation of submelt laser annealed arsenic ultrashallow junctions in silicon during subsequent thermal treatment Giubertoni D, Pepponi G, Sahiner MA, Kelty SP, Gennaro S, Bersani M, Kah M, Kirkby KJ, Doherty R, Foad MA, Meirer F, Streli C, Woicik JC, Pianetta P Journal of Vacuum Science & Technology B, 28(1), C1B1, 2010 |
| 8 |
Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon Pepponi G, Giubertoni D, Bersani M, Meirer F, Ingerle D, Steinhauser G, Streli C, Hoenicke P, Beckhoff B Journal of Vacuum Science & Technology B, 28(1), C1C59, 2010 |