검색결과 : 37건
| No. | Article |
|---|---|
| 1 |
Gas-assisted focused electron beam and ion beam processing and fabrication Utke I, Hoffmann P, Melngailis J Journal of Vacuum Science & Technology B, 26(4), 1197, 2008 |
| 2 |
Simple model for dielectrophoretic alignment of gallium nitride nanowires Motayed A, He MQ, Davydov AV, Melngailis J, Mohammad SN Journal of Vacuum Science & Technology B, 25(1), 120, 2007 |
| 3 |
Annealing of electron beam induced deposits of platinum from Pt(PF3)(4) Ervin MH, Chang D, Nichols B, Wickenden A, Barry J, Melngailis J Journal of Vacuum Science & Technology B, 25(6), 2250, 2007 |
| 4 |
Photolithography using an optical microscope Gonski R, Melngailis J Journal of Vacuum Science & Technology B, 25(6), 2451, 2007 |
| 5 |
CMOS and post-CMOS on-chip microwave pulse power detectors Jeon W, Melngailis J Solid-State Electronics, 50(6), 951, 2006 |
| 6 |
Writing the identity in radio frequency identity tags with focused ion-beam implantation of transistor gates De Marco A, Bandy W, Parsa S, Kaufmann H, Melngailis J Journal of Vacuum Science & Technology B, 23(6), 2811, 2005 |
| 7 |
Electrodes for carbon nanotube devices by focused electron beam induced deposition of gold Brintlinger T, Fuhrer MS, Melngailis J, Utke I, Bret T, Perentes A, Hoffmann P, Abourida M, Doppelt P Journal of Vacuum Science & Technology B, 23(6), 3174, 2005 |
| 8 |
Maskless fabrication of JFETs via focused ion beams De Marco AJ, Melngailis J Solid-State Electronics, 48(10-11), 1833, 2004 |
| 9 |
Design and fabrication of Schottky diode, on-chip RF power detector Jeon W, Firestone TM, Rodgers JC, Melngailis J Solid-State Electronics, 48(10-11), 2089, 2004 |
| 10 |
Testing new chemistries for mask repair with focused ion beam gas assisted etching Stanishevsky A, Edinger K, Orloff J, Melngailis J, Stewart D, Williams A, Clark R Journal of Vacuum Science & Technology B, 21(6), 3067, 2003 |