1 |
Influence of thickness on the structural properties of radio-frequency and direct-current magnetron sputtered TiO2 anatase thin films Mukherjee SK, Nebatti A, Mohtascham F, Schipporeit S, Notthoff C, Mergel D Thin Solid Films, 558, 443, 2014 |
2 |
Structural and electrical properties of Nb-doped TiO2 films sputtered with plasma emission control Mukherjee SK, Becker HW, Bedini APC, Nebatti A, Notthoff C, Rogalla D, Schipporeit S, Soleimani-Esfahani A, Mergel D Thin Solid Films, 568, 94, 2014 |
3 |
Post-heating of SiO2 films for optical coatings Jerman M, Mergel D Thin Solid Films, 516(23), 8749, 2008 |
4 |
Structural investigation of thin TiO2 films prepared by evaporation and post-heating Jerrnan M, Mergel D Thin Solid Films, 515(17), 6904, 2007 |
5 |
Dielectric modeling of transmittance spectra of thin ZnO : Al films Qiao ZH, Agashe C, Mergel D Thin Solid Films, 496(2), 520, 2006 |
6 |
Comparison of radio-frequency and direct-current magnetron sputtered thin In2O3 : Sn films Qiao ZH, Mergel D Thin Solid Films, 484(1-2), 146, 2005 |
7 |
Thickness dependence of In2O3 : Sn film growth Qiao Z, Latz R, Mergel D Thin Solid Films, 466(1-2), 250, 2004 |
8 |
Structural and electrical properties of In2O3 : Sn films prepared by radio-frequency sputtering Mergel D, Schenkel M, Ghebre M, Sulkowski M Thin Solid Films, 392(1), 91, 2001 |
9 |
Modeling thin TiO2 films of various densities as an effective optical medium Mergel D Thin Solid Films, 397(1-2), 216, 2001 |
10 |
Density and refractive index of TiO2 films prepared by reactive evaporation Mergel D, Buschendorf D, Eggert S, Grammes R, Samset B Thin Solid Films, 371(1-2), 218, 2000 |