검색결과 : 13건
| No. | Article |
|---|---|
| 1 |
A Facile Solution-Doping Method to Improve a LowTemperature Zinc Oxide Precursor: Towards Low-Cost Electronics on Plastic Foil Weber D, Botnaras S, Pham DV, Merkulov A, Steiger J, Schmechel R, De Cola L Advanced Functional Materials, 24(17), 2537, 2014 |
| 2 |
Advanced secondary ion mass spectroscopy quantification in the first few nanometer of B, P, and As ultrashallow implants Merkulov A, Peres P, Choi S, Horreard F, Ehrke HU, Loibl N, Schuhmacher M Journal of Vacuum Science & Technology B, 28(1), C1C48, 2010 |
| 3 |
High-quality ZnS shells for CdSe nanoparticles: Rapid microwave synthesis Ziegler J, Merkulov A, Grabolle M, Resch-Genger U, Nann T Langmuir, 23(14), 7751, 2007 |
| 4 |
Growth of new nonlinear crystals LiMX2 (M = Al, In, Ga; X = S, Se, Te) for the mid-IR optics Isaenko L, Vasilyeva I, Merkulov A, Yelisseyev A, Lobanov S Journal of Crystal Growth, 275(1-2), 217, 2005 |
| 5 |
CsLiB6O10 crystals with Cs deficit: structure and properties Isaenko L, Vasilyeva I, Merkulov A, Tomilenko A, Bogdanova I, Malakhov V, Drebushchak V Journal of Crystal Growth, 282(3-4), 407, 2005 |
| 6 |
Toward accurate in-depth profiling of As and P ultra-shallow implants by SIMS Merkulov A, de Chambost E, Schuhmacher M, Peres P Applied Surface Science, 231-2, 640, 2004 |
| 7 |
Evaluation of BN-delta-doped multilayer reference materials for shallow depth profiling in SIMS: round-robin test Toujou F, Yoshikawa S, Homma Y, Takano A, Takenaka H, Tomita M, Li Z, Hasegawa T, Sasakawa K, Schuhmacher M, Merkulov A, Kim HK, Moon DW, Hong T, Won JY Applied Surface Science, 231-2, 649, 2004 |
| 8 |
Latest developments for the CAMECA ULE-SIMS instruments: IMS Wf and SC-Ultra de Chambost E, Merkulov A, Peres P, Rasser B, Schuhmacher M Applied Surface Science, 231-2, 949, 2004 |
| 9 |
Accurate on-line depth calibration with a laser interferometer during SIMS profiling on the Cameca IMS WF instrument Merkulov A, Merkulova O, de Chambost E, Schuhmacher M Applied Surface Science, 231-2, 954, 2004 |
| 10 |
Accurate in depth profiling of As and P shallow implants by secondary ion mass spectroscopy de Chambost E, Merkulov A, Schuhmacher M, Peres P Journal of Vacuum Science & Technology B, 22(1), 341, 2004 |