검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Residual stress characterization of Al/SiC nanoscale multilayers using X-ray synchrotron radiation Singh DRP, Deng X, Chawla N, Bai J, Hubbard C, Tang G, Shen YL Thin Solid Films, 519(2), 759, 2010 |
| No. | Article |
|---|---|
| 1 |
Residual stress characterization of Al/SiC nanoscale multilayers using X-ray synchrotron radiation Singh DRP, Deng X, Chawla N, Bai J, Hubbard C, Tang G, Shen YL Thin Solid Films, 519(2), 759, 2010 |