화학공학소재연구정보센터
검색결과 : 23건
No. Article
1 LiPON thin films with high nitrogen content for application in lithium batteries and electrochromic devices prepared by RF magnetron sputtering
Su Y, Falgenhauer J, Polity A, Leichtweiss T, Kronenberger A, Obel J, Zhou S, Schlettvvein D, Janek J, Meyer BK
Solid State Ionics, 282, 63, 2015
2 The influence of oxygen flow rate on properties of SnO2 thin films grown epitaxially on c-sapphire by chemical vapor deposition
Lu YM, Jiang J, Xia C, Kramm B, Polity A, He YB, Klar PJ, Meyer BK
Thin Solid Films, 594, 270, 2015
3 Stannic oxide thin film growth via ion-beam-sputtering
Becker M, Hamann R, Polity A, Meyer BK
Thin Solid Films, 553, 26, 2014
4 Morphological, structural and electrical investigations on non-polar a-plane ZnO epilayers
Lautenschlaeger S, Eisermann S, Hofmann MN, Roemer U, Pinnisch M, Laufer A, Meyer BK, von Wenckstern H, Lajn A, Schmidt F, Grundmann M, Blaesing J, Krost A
Journal of Crystal Growth, 312(14), 2078, 2010
5 Sputter deposition of ZnO thin films at high substrate temperatures
Eisermann S, Sann J, Polity A, Meyer BK
Thin Solid Films, 517(20), 5805, 2009
6 Hydrogen and nitrogen incorporation in ZnO thin films grown by radio-frequency (RF) sputtering
Eisermann S, Kronenberger A, Dietrich M, Petznick S, Laufer A, Polity A, Meyer BK
Thin Solid Films, 518(4), 1099, 2009
7 Annealing effects on VO2 thin films deposited by reactive sputtering
Fu GH, Polity A, Volbers N, Meyer BK
Thin Solid Films, 515(4), 2519, 2006
8 Quasi-epitaxial growth of thick CuInS2 films by RF reactive sputtering with a thin epilayer buffer
He YB, Krost A, Blasing J, Kriegseis W, Polity A, Meyer BK, Kisielowski C
Thin Solid Films, 451-52, 229, 2004
9 Structural and electronic properties of magnesium-3D transition metal switchable mirrors
Farangis B, Nachimuthu P, Richardson TJ, Slack JL, Meyer BK, Perera RCC, Rubin MD
Solid State Ionics, 165(1-4), 309, 2003
10 Characterisation of GaN films grown on sapphire by low-temperature cyclic pulsed laser deposition/nitrogen rf plasma
Sanguino P, Niehus M, Melo LV, Schwarz R, Koynov S, Monteiro T, Soares J, Alves H, Meyer BK
Solid-State Electronics, 47(3), 559, 2003