검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
The investigation of 4H-SiC/SiO2 interfaces by optical and electrical measurements Ishida Y, Takahashi T, Okumura H, Jikimoto T, Tsuchida H, Yoshikawa M, Tomioka Y, Midorikawa M, Hijikata Y, Yoshida S Materials Science Forum, 389-3, 1013, 2002 |
| 2 |
Characterization of the interfaces between SiC and oxide films by spectroscopic ellipsometry Tomioka Y, Iida T, Midorikawa M, Tukada H, Yoshimoto K, Hijikata Y, Yaguchi H, Yoshikawa M, Ishida Y, Kosugi R, Yoshida S Materials Science Forum, 389-3, 1029, 2002 |