검색결과 : 5건
No. | Article |
---|---|
1 |
Wet-chemical preparation of silicate adlayer reconstructed SiC(0001) surfaces as studied by PIES and LEED Sieber N, Seyller T, Graupner R, Ley L, Mikalo RP, Hoffmann P, Batchelor D, Schmeisser D Materials Science Forum, 389-3, 717, 2002 |
2 |
PEEM - a spectromicroscopic tool for mc-Si surface evaluation Hoffmann P, Mikalo RP, Schmeisser D Solar Energy Materials and Solar Cells, 72(1-4), 517, 2002 |
3 |
Oxide growth on SiC(0001) surfaces Schmeisser D, Batchelor DR, Mikalo RP, Hoffmann P, Lloyd-Spetz A Applied Surface Science, 184(1-4), 340, 2001 |
4 |
Comparison of HF and ozone treated SiC surfaces Mikalo RP, Hoffmann P, Batchelor DR, Lloyd-Spetz A, Lundstrom I, Schmeisser D Materials Science Forum, 353-356, 219, 2001 |
5 |
A spectro-microscopic approach for spatially resolved characterisation of semiconductor structures in PEEM Hoffmann P, Mikalo RP, Schmeisser D Solid-State Electronics, 44(5), 837, 2000 |